Scanning Kelvin probe and photoemission electron microscopy of organic source-drain structures

Noncontact potentiometry of polymer field-effect transistors

Lukas Bürgi, Henning Sirringhaus, Richard H. Friend · Applied Physics Letters · 2002 · 331 citations

Organic Charge-transfer Compound, Accumulation Layer, Electrical Engineering +14

Subthreshold characteristics of field effect transistors based on poly(3-dodecylthiophene) and an organic insulator

S. Scheinert, G. Paasch, M. Schrödner et al. · Journal of Applied Physics · 2002 · 183 citations

Engineering, Organic Electronics, Semiconductor Materials +17

Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices

Sascha Sadewasser, Thilo Glatzel, S. Schuler et al. · Thin Solid Films · 2003 · 124 citations

Materials Science, Engineering, Microscopy +11

Lateral Doping Inhomogeneities as Revealed by μ-NEXAFS and μ-PES

R.P. Mikalo, P. Hoffmann, Th. Heller et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1998 · 15 citations

Engineering, Applied Physics, Condensed Matter Physics +4