Depth profiling of taxol-loaded poly(styrene-b-isobutylene-b-styrene) using Ga+ and C60+ ion beams

A C₆₀ Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer et al. · Analytical Chemistry · 2003 · 539 citations

Natural Sciences, Chemistry, Materials Science +15

Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)

A. Benninghoven · Angewandte Chemie International Edition in English · 1994 · 513 citations

Natural Sciences, Chemistry, Materials Science +16

Microscope imaging by time-of-flight secondary ion mass spectrometry

B. Schueler · Microscopy Microanalysis Microstructures · 1992 · 216 citations · Full text

Natural Sciences, Chemistry, Analytical Chemistry +13

Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics

Anthony D. Appelhans, J.E. Delmore · Analytical Chemistry · 1989 · 210 citations

Natural Sciences, Chemistry, Analytical Chemistry +5

Physical characterization of controlled release of paclitaxel from the TAXUS™ Express²™ drug‐eluting stent

Shrirang V. Ranade, Kathleen M. Miller, Robert E. Richard et al. · Journal of Biomedical Materials Research Part A · 2004 · 184 citations

Pharmacy, Bioengineering, Pharmaceutics +17