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Silicon-carbide high-voltage (400 V) Schottky barrier diodes
182
Citations
3
References
1992
Year
Semiconductor TechnologyElectrical EngineeringSemiconductor DeviceEngineeringHigh Voltage EngineeringApplied PhysicsPower Semiconductor DeviceForward I-v CharacteristicsSchottky Barrier DiodesMicroelectronicsReverse I-v CharacteristicsPower Electronic Devices
The authors describe the fabrication and characteristics of the first high-voltage (400-V) silicon-carbide (6H-SiC) Schottky barrier diodes. Measurements of the forward I-V characteristics of these diodes demonstrate a low forward voltage drop of approximately 1.1 V at an on-state current density of 100 A/cm/sup 2/ for a temperature range of 25 to 200 degrees C. The reverse I-V characteristics of these devices exhibit a sharp breakdown, with breakdown voltages exceeding 400 V at 25 degrees C. In addition, these diodes are shown to have superior reverse recovery characteristics when compared with high-speed silicon P-i-N rectifiers.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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