An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy - Concepedia

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Publication | Open Access

An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

DOI Full Paper Access

509

Citations

44

References

2008

Year

Malcolm R. Howells, Tobias Beetz, Henry N. Chapman, Chuan Cui, James M. Holton, Chris Jacobsen, Janos Kirz, Enju Lima, Stefano Marchesini, Houxun Miao,

Journal of Electron Spectroscopy and Related Phenomena

EngineeringPhysicsMedical ImagingMicroscopyMicroscopy MethodX-ray DiffractionApplied PhysicsDiffractionResolution LimitationX-ray Diffraction MicroscopySuper-resolutionSynchrotron RadiationRadiographic ImagingCrystallographyX-ray Optic

References

	Year	Citations

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