IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control · 2010 · 42 citations · 13 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsMicrowave EngineeringFrequency MetrologyHigh-frequency Semiconductor DevicesMicrowave Integrated CircuitsMicrowave OscillatorsMicrowave ResonatorsRadio-frequency Integrated CircuitsCmos OscillatorsDrift CompensationFrequency CompensationFrequency DriftFrequency ReferencesHardware Drift CompensationPhase NoisePhase Noise Compensation
A temperature-compensated 1.5 GHz film bulk acoustic wave resonator (FBAR)-based frequency reference implemented in a 0.35 microm CMOS process is presented. The ultra-small form factor (0.79 mm x 1.72 mm) and low power dissipation (515 microA with 2 V supply) of a compensated FBAR oscillator present a promising alternative for the replacement of quartz crystal frequency references. The measured post-compensation frequency drift over a 0-100 degrees C temperature range is < +/- 10 ppm. The measured oscillator phase noise is -133 dBc/Hz at 100 kHz offset from the 1.5 GHz carrier.
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Ultra-miniature high-Q filters and duplexers using FBAR technology
R. Ruby, P. Bradley, John D. Larson et al. · 2002 · 161 citations