Frequency Metrology

Frequency Metrology is the branch of metrology that deals with the realization, measurement, comparison, and dissemination of periodic signal frequencies, particularly those of time and electromagnetic-wave standards, with quantified uncertainties and traceability to the SI second.

2.7K

Publications

137.2K

Citations

7K

Authors

1.4K

Institutions

Publications per year

2017–2026

486

Authors

7K

  1. SA
    Scott A. Diddams

    National Institute of Standards and Technology, United States

    42 publications · 12.1K citations

    31

    h-index

  2. RH
    Ronald Holzwarth

    Max Planck Institute of Quantum Optics, Germany

    36 publications · 8.7K citations

    25

    h-index

  3. TP
    T.E. Parker

    National Institute of Standards and Technology, United States

    32 publications · 2.8K citations

    22

    h-index

  4. TW
    Theodor W. Hänsch

    Max Planck Institute of Quantum Optics, Germany

    28 publications · 4.7K citations

    21

    h-index

  5. LH
    L. Hollberg

    National Institute of Standards and Technology, United States

    26 publications · 2.4K citations

    20

    h-index

1–5 of 7K

Venues

  1. Optics Letters

    151 publications · 9.2K citations

    52

    h-index

  2. Optics Express

    167 publications · 8K citations

    49

    h-index

  3. Metrologia

    140 publications · 8.1K citations

    47

    h-index

  4. 40

    h-index

  5. Review of Scientific Instruments

    100 publications · 5.5K citations

    33

    h-index

1–5