2012 · 10 citations · 6 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureEmbedded SystemsSystem-on-chip DesignAccelerator ArchitectureField-programmable Gate Array ArchitectureInstruction Set ArchitectureProcessor Core Design
The DFT and test challenges faced, and the solutions applied, to the Cortex-A15 microprocessor core are described in this paper. New DFT techniques have been created to address the challenges of distributing a DFT flow that addresses multiple identical CPUs that will ultimately end up in many different design and test environments. We describe work done with EDA vendors to ensure that all mutual customers are able to implement this flow. In addition, this paper discusses the use of the ARM MBIST standardized interface in conjunction with a 3 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">rd</sup> party MBIST controller for the first time. We collaborated closely with the 3 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">rd</sup> party tool company and met all of the challenges to get this first time flow and tool capability working successfully on silicon.
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A structured test re-use methodology for core-based system chips
Test Access Mechanism for Multiple Identical Cores
Grady Giles, J. Wang, Anuja Sehgal et al. · 2008 · 50 citations
Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip
R. Molyneaux, Tom Ziaja, Hong Bin Kim et al. · 2007 · 27 citations