Practical, non-invasive optical probing for flip-chip devices

Abstract

A new tool for performing picosecond imaging circuit analysis (PICA) is described. The tool has /spl plusmn/15 ps timing accuracy and can be used with a wide variety of testers. The key design decisions in and limitations of this PICA system are outlined. A low noise, low jitter imaging detector is employed to both visualize the emission sources and provide precise timing information. The daunting challenges of weak signals, image stabilization and complex data acquisition have been successfully met. We briefly describe new methodologies and tools that are needed to realize its potential as well as how such a PICA system could be adopted by debug and failure analysis teams.