2004 · 32 citations · 7 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceMicroelectronicsSemiconductor DevicesCmos Circuit DesignHardware Fault ToleranceRadiation HardeningLatch DesignRadiation-hardened Integrated CircuitsRadiation-hardening Techniques
In this paper, we proposed a soft-error hardened latch (SEH-latch) scheme that has an error correction function in the fine process. To achieve this, we designed two types of SEH-latch circuits and a standard latch circuit using 130 nm 2-well, and also 90 nm 2-well CMOS processes. The proposed circuit demonstrated 2-order higher immunity through a radiation test using /spl alpha/-particles, and 1-order higher immunity through neutron irradiation.
7
Impact of CMOS process scaling and SOI on the soft error rates of logic processes
S.A. Hareland, J. Maiz, M. Alavi et al. · 2002 · 120 citations
Engineering, Computer Engineering, Electrical Engineering +17