Recombination behavior and contact resistance of n+ and p+ poly-crystalline Si/mono-crystalline Si junctions

Measurement of Sheet Resistivities with the Four-Point Probe

F. M. Smits · Bell System Technical Journal · 1958 · 1.6K citations

Materials Science, Circular Samples, Engineering +15

24.7% Record Efficiency HIT Solar Cell on Thin Silicon Wafer

Mikio Taguchi, Ayumu Yano, Satoshi Tohoda et al. · IEEE Journal of Photovoltaics · 2013 · 1.1K citations

Engineering, Energy Efficiency, Practical Size +19

Passivated rear contacts for high-efficiency n-type Si solar cells providing high interface passivation quality and excellent transport characteristics

Frank Feldmann, Martin Bivour, Christian Reichel et al. · Solar Energy Materials and Solar Cells · 2013 · 718 citations

Electrical Engineering, Engineering, Applied Physics +5

Measurement of the emitter saturation current by a contactless photoconductivity decay method.

D.E. Kane, R.M. Swanson · Photovoltaic Specialists Conference · 1985 · 447 citations

Electrical Engineering, Photoelectric Sensor, Engineering +6

An investigation of the thermal stability of the interfacial oxide in polycrystalline silicon emitter bipolar transistors by comparing device results with high-resolution electron microscopy observations

G.R. Wolstenholme, N Jorgensen, P. Ashburn et al. · Journal of Applied Physics · 1987 · 172 citations

Engineering, Integrated Circuits, Interfacial Oxide +17