Publication | Closed Access
Recombination behavior and contact resistance of n+ and p+ poly-crystalline Si/mono-crystalline Si junctions
220
Citations
15
References
2014
Year
EngineeringPhysicsNanoelectronicsApplied PhysicsSiliceneSemiconductor MaterialRecombination BehaviorSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsContact Resistance
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