X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films

Core Level Photelectron and X-Ray Absorption Spectroscopy of Free Argon Clusters: Size-Dependent Energy Shifts and Determination of Surface Atom Coordination

Olle Björneholm, F. Federmann, F. Fössing et al. · Physical Review Letters · 1995 · 146 citations · Full text

Natural Sciences, Chemistry, Physics +17

Measurement and calculation of polarization and potential-energy effects on core-electron binding energies in solids: X-ray photoemission of rare gases implanted in noble metals

P. H. Citrin, D. R. Hamann · Physical review. B, Solid state · 1974 · 145 citations

Natural Sciences, Materials Science, Physics +17

Surface charge neutralization of insulating samples in x-ray photoemission spectroscopy

Paul E. Larson, Michael A. Kelly · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1998 · 98 citations

Natural Sciences, Materials Engineering, Materials Science +9

Radiation damage in silicon (001) due to low energy (60–510 eV) argon ion bombardment

A. Al-Bayati, Kevin Orrman-Rossiter, R. Badheka et al. · Surface Science · 1990 · 57 citations

Engineering, Materials Science, Physics +13

Argon incorporation in Si(100) by ion bombardment at 15–100 eV

W. M. Lau, I. Bello, L. J. Huang et al. · Journal of Applied Physics · 1993 · 54 citations

Natural Sciences, Materials Science, Physics +10