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Development of Heterojunction Diode-Type Gamma Ray Detectors Based on Epitaxially Grown Thick CdTe on$hboxn^+$-Si Substrates
19
Citations
10
References
2006
Year
SemiconductorsRoom TemperatureElectrical EngineeringReverse Leakage CurrentsEngineeringRadiation DetectionPhysicsCrystalline DefectsEnergy Discrimination CapabilitySemiconductor TechnologyApplied PhysicsSemiconductor MaterialDetector PhysicNuclear MaterialsMolecular Beam EpitaxyEpitaxial GrowthCompound Semiconductor
Room temperature nuclear radiation detectors with energy discrimination capability developed by growing thick cadmium telluride (CdTe) epitaxial layers directly on n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> -Si substrates in a metal-organic vapor phase epitaxy system is reported for the first time. The CdTe/n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> -Si heterojunction diode detector exhibited good rectification and charge collection properties. The reverse leakage currents were typically 1times10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-7</sup> to 5times10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-7 </sup> A/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> at 50-V bias. The detector clearly demonstrated its energy discrimination capability by resolving gamma peak from the <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">241</sup> Am radioisotope during radiation detection test at room temperature
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