IEEE Electron Device Letters · 2006 · 19 citations · 10 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsGamma-ray DetectionSemiconductor Crystal GrowthSemiconductor DetectorsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsCadmium TellurideCadmium Telluride DetectorsCharge CollectionDetector FabricationEnergy DiscriminationEnergy Discrimination DetectorsSemiconductor Gamma-ray DetectorsSemiconductor Radiation Detectors
Room temperature nuclear radiation detectors with energy discrimination capability developed by growing thick cadmium telluride (CdTe) epitaxial layers directly on n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> -Si substrates in a metal-organic vapor phase epitaxy system is reported for the first time. The CdTe/n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> -Si heterojunction diode detector exhibited good rectification and charge collection properties. The reverse leakage currents were typically 1times10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-7</sup> to 5times10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-7 </sup> A/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> at 50-V bias. The detector clearly demonstrated its energy discrimination capability by resolving gamma peak from the <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">241</sup> Am radioisotope during radiation detection test at room temperature
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M. Niraula, K. Yasuda, Hironori Ohnishi et al. · Journal of Electronic Materials · 2006 · 31 citations