2002 · 27 citations · 0 references
EngineeringElectrical EngineeringLow-power DesignMicroelectronicsLow-dose Radiation EffectsIonizing IrradiationIonizing Radiation DosimetryLow-dose EffectsLow-dose Ionizing RadiationSingle Event EffectsSingle Event Upset ModelingTotal DoseTotal Ionizing Dose Effects
Single event effects and total ionizing dose results for a 28LV010 low voltage (3.3-volt) 1 Mbit EEPROM are presented. The results are compared with 28C010 (5.0-volt) data from similar 1-Mbit EEPROM's.