A hysteresis model for a vanadium dioxide transition-edge microbolometer

Abstract

This paper presents the adaptation of the Preisach model, originally developed for magnetic hysteresis, to describe mathematically the hysteresis in the resistance-temperature characteristics of vanadium-dioxide (VO/sub 2/) thin film radiation sensors. The necessary and sufficient conditions for the applicability of the Preisach model to a VO/sub 2/ film sensor are experimentally verified. Experimentally measured characteristics are compared with those given by the model for minor and major loops.