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Surface layer determination for the Si spheres of the Avogadro project
76
Citations
37
References
2011
Year
Materials ScienceCorrection ParametersSurface CharacterizationEngineeringMeasurementCalibrationSurface AnalysisSurface ScienceApplied PhysicsSilicon SurfaceEducationSl Mass MslSurface Layer DeterminationInstrumentationSi SpheresSurface ProcessingSurface ReconstructionAvogadro Project
For the accurate determination of the Avogadro constant, two 28Si spheres were produced, whose macroscopic density, in addition to other values, must be determined. To make a contribution to the new definition of the kilogram, a relative standard uncertainty of less than 2 × 10−8 has to be achieved. Each silicon surface is covered by a surface layer (SL). Consequently, correction parameters for the SL are determined to be applied to the mass and volume determination of the enriched spheres. With the use of a large set of surface analysing techniques, the structure of the SL is investigated. An unexpected metallic contamination existing on the sphere surface enlarges the uncertainty contribution of the correction parameters above the originally targeted value of 1 × 10−8. In the framework of this investigation this new obstacle is resolved in two ways. A new combination of analytical methods is applied to measure the SL mass mSL and the thickness dSL, including this new contamination, with an uncertainty of u(mSL) = 14.5 µg and 14.4 µg, respectively, and u(dSL) = 0.33 nm and 0.32 nm for the 28Si spheres AVO28-S5 and AVO28-S8, respectively.
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