I. Busch - Concepedia

Author

I. Busch

Physikalisch-Technische Bundesanstalt

Also Known As

Busch, Ingo, I Busch, I. Busch, Ingo Busch

Publications

891

Citations

H-Index

Concepts

All Affiliations

Physikalisch-Technische Bundesanstalt Istituto Nazionale di Ricerca Metrologica Bureau international des poids et mesures National Institute of Standards and Technology Swiss Federal Institute of Metrology

About

I. Busch is an author at Physikalisch-Technische Bundesanstalt specializing in engineering, measurement, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	5	5	158
2	Education	3	3	121
3	Applied Physics	2	2	97
4	Biostatistics	1	1	15
5	Chemistry	1	1	21

I. Busch

Publications

623

Citations

H-Index

Page 1

	Year	Citations
Counting the atoms in a<sup>28</sup>Si crystal for a new kilogram definition Birk Andreas, Yasushi Azuma, Guido Bartl, Metrologia	2011	184
Realization of the kilogram by the XRCD method Kenichi Fujii, H. Bettin, Peter Becker, Metrologia	2016	131
A new<sup>28</sup>Si single crystal: counting the atoms for the new kilogram definition Guido Bartl, Peter Becker, Burkhard Beckhoff, Metrologia	2017	114
Surface layer determination for the Si spheres of the Avogadro project I. Busch, Yasushi Azuma, H. Bettin, Metrologia Materials ScienceCorrection ParametersSurface CharacterizationEngineeringMeasurement	2011	76
A comparison of future realizations of the kilogram M Stöck, Pauline Barat, Patrick Pinot, Metrologia Industrial DesignPrecision MeasurementEngineeringMeasurementCalibration	2017	30
The Correlation of the <i>N</i>A Measurements by Counting 28Si Atoms G. Mana, E. Massa, Carlo Paolo Sasso, Journal of Physical and Chemical Reference Data	2015	26
Oxide Layer Mass Determination at the Silicon Sphere of the Avogadro Project I. Busch, Hans‐Ulrich Danzebrink, Michael Krumrey, IEEE Transactions on Instrumentation and Measurement EngineeringCrystal Growth TechnologySilicon SphereSolid-state ChemistryThermal Oxidation	2008	21
Realisation and metrological characterisation of thickness standards below 100�nm Peter Thomsen-Schmidt, G. Ulm, Konrad Herrmann, Applied Physics A Precision MeasurementEngineeringNondestructive TestingMeasurementMechanical Engineering	2004	16
Absolute measurement of the activity of using a proportional counter I. Busch, H. Greupner, U. Keyser Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Precision MeasurementEngineeringMeasurementCalibrationProportional Counter	2002	15
Current State of Avogadro ${}^{28}$Si sphere S8 R. Arnold Nicolaus, Guido Bartl, H. Bettin, IEEE Transactions on Instrumentation and Measurement	2013	10

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