Publication | Closed Access
In-flight observations of long-term single-event effect (SEE) performance on Orbview-2 solid state recorders (SSR)
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Citations
22
References
2004
Year
Unknown Venue
Long-term Single-event EffectEngineeringActual Seu RatesTime-of-flight CameraMeasurementAerospace EngineeringData AcquisitionComputer ArchitectureComputer EngineeringSystems EngineeringEducationSpace SciencesBomb Damage AssessmentInstrumentationNasa Orbview-2 MissionSolid State RecorderIn-flight ObservationsFlight Validation
We present multi-layer single event upset (SEU) flight data on solid state recorder (SSR) memories for the NASA Orbview-2 mission. Actual SEU rates are compared to the predicted rates based on ground test data and environment models.
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