Physics Procedia · 2008 · 65 citations · 6 references
Optical DesignEngineeringMicroscopyElectron DiffractionComputer-aided DesignNew Program EodNew ProgramElectron OpticElectron MicroscopyOptical PropertiesOptical System DesignElectron Optical PropertiesInstrumentationComputational GeometryGeometric ModelingPhysicsClassical OpticsNatural SciencesElectron Optical DesignGeometrical OpticApplied PhysicsElectron Microscope
The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno. © 2008
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Computation of electrostatic lenses and multipoles by the first order finite element method
Bohumila Lencová · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1995 · 35 citations
Numerical Analysis, Finite Element Method, Method Of Fundamental Solution +9