A 20-Gb/s Burst-Mode Clock and Data Recovery Circuit Using Injection-Locking Technique

Jri Lee, Mingchung Liu

IEEE Journal of Solid-State Circuits · 2008 · 68 citations · 10 references

Concepts

Abstract

A 20-Gb/s clock and data recovery circuit incorporates injection-locking technique to achieve high-speed operation with low power dissipation. The circuit creates spectral line at the frequency of data rate and injection-locks two cascaded LC oscillators. A frequency-monitoring mechanism is employed to ensure a close matching between the VCO natural frequency and data rate. Fabricated in 90-nm CMOS technology, this circuit achieves a bit error rate of less than 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-9</sup> in both continuous (PRBS of 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">31</sup> -1) and burst modes while consuming 175 mW from a 1.5-V supply.

References

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