Hot electron spectroscopy and microscopy

Abstract

Semiconductor heterostructures, such as double-barrier resonant tunnelling diodes and superlattices, are nowadays used for many applications. One very versatile and powerful method to study electronic transport in heterostructures is hot electron spectroscopy. Hot electron spectroscopy can be carried out in two complementary versions: device-based techniques usually employ so-called hot electron transistors (HETs), while ballistic electron emission microscopy (BEEM) uses a scanning tunnelling microscope (STM) as the source of ballistic electrons.