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High-Performance Single-Crystal-Like Nanowire Poly-Si TFTs With Spacer Patterning Technique
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Citations
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References
2011
Year
EngineeringNanocomputingSilicon On InsulatorSemiconductor NanostructuresNanoelectronicsNanoscale ScienceNanolithography MethodMaterials ScienceCrystalline DefectsNanotechnologySpacer Patterning TechniqueSemiconductor Device FabricationMicroelectronicsSimple SpacerElectronic MaterialsDevice ChannelApplied PhysicsNanofabricationThin Films
In this letter, high-performance single-crystal-like nanowire poly-Si TFTs with simple spacer patterning technique were demonstrated and characterized. Due to the nanoscale dimension formed by spacer patterning technique, each nanowire is easily transformed within one crystalline grain of the standard sequential-lateral-solidification (SLS) poly-Si film with the regularly arranged grains and thus performed with a single-crystal like device channel. Due to the high-crystallinity channel, together with the tri-gated structure, the fabricated devices revealed good device integrity of high field-effect mobility of 477 cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> /V · s and good ON/OFF current ratio of 1.07 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">8</sup> .
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