Publication | Closed Access
Monitoring chip fatigue in an IGBT module based on grey relational analysis
20
Citations
19
References
2015
Year
Electrical EngineeringReliability EngineeringEngineeringHardware ReliabilityChip FatiguePhysic Of FailureComputer EngineeringIgbt ModuleEngineering Failure AnalysisCircuit ReliabilityElectronic PackagingDevice ReliabilityMicroelectronicsGrey Relational Analysis
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