Publication | Closed Access
Characterization of polycrystalline silicon carbide films grown by atmospheric pressure chemical vapor deposition on polycrystalline silicon
48
Citations
14
References
1998
Year
Materials ScienceEngineeringApplied PhysicsPolycrystalline SiliconThin FilmsChemical DepositionChemical Vapor DepositionThin Film ProcessingCarbide
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