A simple fault-tolerant digital voter circuit in TMR nanoarchitectures

Tian Ban, Lírida Naviner

2010 · 71 citations · 15 references

Concepts

Abstract

Nanoelectronic systems are now more and more prone to faults and defects, permanent or transient. Redundancy techniques are implemented widely to increase the reliability, especially the TMR - Triple Modular Redundancy. However, many researchers assume that the voter is perfect and this may not be true. This paper proposes a simple but effective fault-tolerant voter circuit which is more reliable and less expensive. Experimental results demonstrate its improvement over the former TMR structures.

References

15