A simple fault-tolerant digital voter circuit in TMR nanoarchitectures

Abstract

Nanoelectronic systems are now more and more prone to faults and defects, permanent or transient. Redundancy techniques are implemented widely to increase the reliability, especially the TMR - Triple Modular Redundancy. However, many researchers assume that the voter is perfect and this may not be true. This paper proposes a simple but effective fault-tolerant voter circuit which is more reliable and less expensive. Experimental results demonstrate its improvement over the former TMR structures.