Materials reliability in MEMS devices

Stuart B. Brown, William Van Arsdell, Christopher L. Muhlstein

2002 · 105 citations · 4 references

Concepts

Abstract

Reliable operation of MEMS requires development of accelerated testing techniques and protocols. One such technique using resonant fatigue specimens has demonstrated a failure mode that was previously unknown. This work indicates that moisture can decrease the lifetime of cyclicly stressed polysilicon components.

References

4