Low-threshold continuous-wave surface emitting lasers with etched void confinement

C.C. Hansing, H. Deng, Diana L. Huffaker, D.G. Deppe, B. G. Streetman, J. Sarathy

IEEE Photonics Technology Letters · 1994 · 38 citations · 5 references

Concepts

Abstract

Data are presented demonstrating low threshold continuous wave operation of AlAs/GaAs/InGaAs vertical cavity surface emitting lasers. Continuous wave thresholds of 470 μA have been realized for device diameters of /spl sim/4 μm, and 1.1 mA for a device diameter of 10 μm. A two-step molecular beam epitaxial growth process is used which results in a buried etched void surrounding the active cavity of the laser.

References

5