IEEE Transactions on Circuits and Systems I Regular Papers · 2009 · 56 citations · 31 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSemiconductor DevicesCmos Circuit DesignIntegrated Circuit DesignMixed-signal Integrated Circuit DesignMixed-signal IntegrationOscillatorsRadio-frequency Integrated CircuitsCmos Analog Integrated CircuitsCmos OscillatorsCmos Radio-frequency CircuitsCrystal OscillatorsEnvironmental FactorsJitterJitter SourcesSilicon-based Oscillators
Recent trends in the development of integrated silicon frequency sources are discussed. Within that context, a 25-MHz self-referenced solid-state frequency source is presented and demonstrated where measured performance makes it suitable for replacement of crystal oscillators (XOs) in data interface applications. The frequency source is referenced to a frequency-trimmed and temperature-compensated 800-MHz free-running LC oscillator (LCO) that is implemented in a standard logic CMOS process and with no specialized analog process options. Mechanisms giving rise to frequency drift in integrated LCOs are discussed and supported by analytical expressions. Design objectives and a compensation technique are presented where several implementation challenges are uncovered. Fabricated in a 0.25-mum 1P5M CMOS process, and with no external components, the prototype frequency source dissipates 59.4 mW while maintaining plusmn152 ppm frequency inaccuracy over process, plusmn 10% variation in the power supply voltage, and from - 10degC to 80degC. Variation against other environmental factors is also presented. Nominal period jitter and power-on start-up latency are 2.75 ps <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">rms</sub> and 268 mus, respectively. These performance metrics are compared with an XO at the same frequency.
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A simple model of feedback oscillator noise spectrum
D.B. Leeson · Proceedings of the IEEE · 1966 · 2.4K citations
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