High resolution electron microscopic investigations of dislocations in deformed GaAs single crystals doped with Te

S. K. Maksimov, Manfred L. Ziegler, I. I. Khodos, I. I. Snighiryova, M. Sh. Shikhsaidov

physica status solidi (a) · 1984 · 10 citations · 14 references

Concepts

Abstract

The defect structure of GaAs single crystals doped with tellurium to about 1019 cm−3 and deformed at 500 °C is investigated in the high-resolution electron microscope using three-beam dark-field lattice images along 〈110〉. The images of precipitates at different stages of their formation as well as of dissociated 60° dislocations, dipoles, and stacking fault tetrahedra are taken and analyzed. The succession of the precipitation stages in the tellurium-bearing phase is analyzed, too. There are discrepancies between the periodicity on direct lattice images and the interplanar distances in highly deformed regions in the crystal.

References

14