Tie Importance of Contact Radius for Substrate-Independent Property Measurement of Thin Films - Concepedia

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Tie Importance of Contact Radius for Substrate-Independent Property Measurement of Thin Films

47

Citations

4

References

1998

Year

Jennifer L. Hay, M.E. O'Hern, W. C. Oliver

MRS Proceedings

Materials ScienceSurface CharacterizationEngineeringMicrofabricationContact MechanicSurface ScienceApplied PhysicsNanometrologyThin Film Process TechnologyContact RadiusThin FilmsThin Film ProcessingTie Importance

References

	Year	Citations

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