Vertical cross-point resistance change memory for ultra-high density non-volatile memory applications

Hong Sik Yoon, In-Gyu Baek, Jinshi Zhao, Hyunjun Sim, Min Young Park, Hansin Lee, Gyu-Hwan Oh, Jong Chan Shin, In‐Seok Yeo, U‐In Chung

Symposium on VLSI Technology · 2006 · 44 citations · 0 references

Concepts

Abstract

Vertically defined resistance change memory cells for the vertical cross-point architecture (VCPA) as a high density non-volatile memory application are successfully demonstrated with a NiO switching layer. They showed both unipolar and bipolar switching mode. Several issues in realization for VCPA and their possible solutions are discussed.