Stability problems in point contact solar cells

Abstract

Single-crystal silicon point-contact solar cells show a degradation in their efficiency after being exposed to concentrated sunlight. Two mechanisms appear to be responsible: an increase in surface recombination velocity caused by ultraviolet light, possibly due to electron injection from the silicon into the oxide, and a gradual lowering of the effective carrier lifetime that occurs when the cell is under high-level injection for an extended period of time. Point-contact solar cells whose front-side passivation has a phosphorus as well as a thermal oxide diffusion are dramatically more resistant to ultraviolet radiation damage. Modeling results indicate that it is possible to make a point-contact solar cell that is 26.8% efficient after massive ultraviolet exposure.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>