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4.5 kV 4H-SiC diodes with ideal forward characteristic
32
Citations
4
References
2002
Year
Unknown Venue
Semiconductor TechnologyKv 4H-sic DiodesElectrical EngineeringSemiconductor DeviceEngineeringPower DeviceApplied PhysicsPower Semiconductor DeviceGrown Anode EmittersPower ElectronicsMicroelectronics4H-sic DiodesCarbideTransient Recovery Losses
4H-SiC diodes with 4.5 kV blocking and epitaxially grown anode emitters show near theoretical forward voltages of 3.08 V at 100 A/cm/sup 2/ and 4.10 V at 1000 A/cm/sup 2/ at RT (2.96 V and 4.15 V at 125/spl deg/C), while diodes with implanted emitters show 3.5-3.8 V at 100 A/cm/sup 2/ with -4 mV/K. The transient recovery losses (E/sub rec/, Q/sub rr/) are as low as 1/100 of the reference silicon device. Paralleling of the SiC diodes with silicon IGBTs enables 400 A switching, and system loss savings of nearly 50% compared to state-of-art silicon technology.
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