A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices - Concepedia

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A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices

45

Citations

7

References

2011

Year

Sylvain Pietranico, Stéphane Lefebvre, Sylvie Pommier, M. Berkani Bouaroudj, Serge Bontemps

Microelectronics Reliability

Materials ScienceAluminium NitrideElectrical EngineeringAluminium Metallization LayerEngineeringElectromigration TechniqueCorrosionApplied PhysicsPower Semiconductor DevicesElectronic PackagingDevice ReliabilityMicroelectronicsMicrostructureAnodizing

References

	Year	Citations

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