Publication | Closed Access
3D analytical modelling of subthreshold characteristics in vertical Multiple-gate FinFET transistors
28
Citations
12
References
2011
Year
Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsElectronic EngineeringSubthreshold CharacteristicsBias Temperature InstabilityAnalytical ModellingMicroelectronicsCircuit SimulationMultiscale Modeling
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