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Full-field optical measurement for material parameter identification with inverse methods
25
Citations
3
References
2006
Year
Optical MaterialsEngineeringOptical TestingMechanical EngineeringDigital ManufacturingExperimental TechnologySimulationComputer-aided DesignComputational MechanicsOptical CharacterizationFe SimulationCoherent Gradient SensingOptical PropertiesNumerical SimulationFe SoftwareModeling And SimulationInstrumentationMaterial ParametersPhysicsInverse ProblemsProcess Simulation ModelNatural SciencesSpectroscopyApplied PhysicsOptical EngineeringOptical System AnalysisMaterial Parameter IdentificationVirtual Prototyping
The application of FE simulation in manufacturing processes and virtual prototyping increases every day. In order to allow accurate simulations, correct constitutive models are needed as input to the FE software. A modern and promising way to identify the material parameters in those constitutive models is “inverse modeling”. Full-field measurement is a suitable way to get the necessary experimental data. The technique has many advantages such as large information contents, non-contacting measurement, and versatile size of observation region, among others. However, there is no standardization yet for this kind of measurements. Therefore, there are many disagreements among researchers about how to design DICT experiments and how to correctly collect the data from DICT experiments. This paper will concentrate on discussing the key points of those problems as well as presenting some work experience with the DICT.
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