Journal of the Chemical Society Chemical Communications · 1983 · 10 citations · 0 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials CharacterizationThin FilmsAmorphous MaterialsAmorphous SolidsElectron DiffractionElectron MicroscopyThin-film MaterialsX-ray DiffractionAmorphous CarbonAmorphous State CharacterizationAmorphous StructureAmorphous Thin FilmsBondingCompton ScatteringSpectrometer ResolutionX-ray Diffraction Analysis
Even though a thin of a solid may be ‘structureless’ using the criteria of X-ray and electron diffraction, the nature of the chemical bonding within the film can still be deduced from a profile analysis of Compton scattered electrons; Compton profiles can be measured using a conventional electron microscope fitted with an electron spectrometer of modest resolution.