Physical Review Letters · 1987 · 52 citations · 11 references
EngineeringElectrical EngineeringPhysicsElectromagnetismMicroelectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice ScalingDevice SimulationDevice Scaling EffectsDiode Current-voltage CharacteristicsDiode ModelingElectric Field ScalingSheath Scaling Laws
A new model of relativistic Applied-B ion diodes is presented that appears to explain a previously discovered empirical scaling law. The model is based on a self-consistent calculation of the diamagnetic effect of virtual-cathode location coupled with the assumption of a uniform electron-density profile in the sheath. The success of this model greatly increases our understanding of the undesirable phenomenon of impedance collapse in applied-B diodes and suggests a simple measure for improving their performance.
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Inertial Confinement Fusion with Light Ion Beams
J. Pace VanDevender, D. L. Cook · Science · 1986 · 150 citations
Generation of Intense Ion Beams in Pulsed Diodes
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Theory of intense ion beam acceleration
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Time-resolved proton focus of a high-power ion diode
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