Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation

Abstract

We present results from proton radiation experiments with carbon nanotube field effect transistors. Single event effects were observed consisting of drops in current, with very long durations (100 s of ms), and sudden, discrete switching events between quantized current levels. These studies are important for the development and understanding of advanced nano-electronic devices operating in the space radiation environment.