Publication | Closed Access
Solder joint fatigue models: review and applicability to chip scale packages
504
Citations
22
References
2000
Year
Reliability EngineeringEngineeringChip-scale PackageHardware ReliabilityMechanical EngineeringStructural Health MonitoringChip AttachmentElectronic PackagingStructural MechanicsChip Scale PackagesLow-cycle FatigueMechanics Of MaterialsPhysic Of Failure
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