Polyimide thin-film waveguides: Optical and Raman spectroscopic studies

Abstract

Polyimide films deposited on fused quartz, silicon, and ceramic substrates are examined. Waveguide techniques are used to determine the guide modes from which the index of refraction is inferred. Film thicknesses are determined from transmission interferences and, independently, from a luminescence-induced reflection interference pattern. Using a waveguide configuration we also observed and analyzed Raman scattering features in the region above 1000 cm−1.