On-chip sampling and EMC modeling of I/Os switching to evaluate conducted RF disturbances propagation

Abstract

This paper deals with the propagation of RF disturbances injected inside an integrated circuit. To increase our knowledge about this topic, an on-chip voltage sensor is implemented inside a test vehicle to quantify the conducted RF disturbances injected on the power supply of its I/Os. The experiment results give information about coupling paths taken by conducted disturbances carried into I/Os. I/O immunity thresholds computed from standard external immunity tests (IEC 62132-4) are compared to the one deduced from internal measurements. Moreover, in view of developing simulation tools for IC's immunity prediction, a test vehicle model is proposed. Comparison between simulation results, internal and external measurements raises some discussions about the accuracy of immunity measurement set-ups.