Simultaneous measurement of refractive index and thickness distributions using low-coherence digital holography and vertical scanning

Abstract

The simultaneous measurement method of a refractive index distribution and a thickness distribution using low-coherence digital holography with a vertical scanning is proposed. The proposed method consists of a combination of digital holography and low-coherence interferometry. The introduction of a datum plane enables the measurement of both a refractive index distribution and a thickness distribution. By the optical experiment, the potential of the proposed method is confirmed.