Observation of an interference effect for fluorescent x rays

Abstract

A peculiar angular pattern is observed from K\ensuremath{\alpha}-fluorescent x rays emitted from a Zn monoatomic layer in a Langmuir-Blodgett film onto a Au substrate. A pattern similar to Young's fringe is monitored with a non-energy-dispersive two-dimensional detector (imaging plate), and is quantitatively measured by scanning the slit with an energy-dispersive detector (pure Ge detector). The fringes are in close agreement with a theoretical estimate based on the interference among transmitted and reflected waves at interfaces in the sample.