Publication | Open Access
Dependence of Raman frequencies and scattering intensities on pressure in GaSb, InAs, and InSb semiconductors
141
Citations
24
References
1984
Year
EngineeringRaman FrequenciesInsb SemiconductorsSurface-enhanced Raman ScatteringSpectroscopic PropertyLo PhononsSemiconductor NanostructuresSemiconductorsIi-vi SemiconductorOptical PropertiesOptical SpectroscopyMaterials ScienceSemiconductor TechnologyPhysicsSemiconductor MaterialBrillouin ScatteringNatural SciencesSpectroscopyApplied PhysicsCondensed Matter PhysicsPhononFirst-order Raman Scattering
The first-order Raman scattering by TO and LO phonons has been measured in GaSb, InAs, and InSb under hydrostatic pressures up to their phase transitions. The Raman frequencies increase nearly linearly while the LO-TO splitting decreases with increasing pressure. The scattering intensities display strong enhancement as the ${E}_{1}$ band gaps approach the laser frequencies with increasing pressure. The measured volume dependence of the Raman frequencies and the transverse effective charges is interpreted by means of pseudopotential calculations. The resonance behavior is discussed in terms of resonant Raman scattering near the ${E}_{1}$ gaps.
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