Journal of Applied Physics · 2015 · 58 citations · 34 references
Natural SciencesMaterials EngineeringMaterials ScienceCondensed Matter PhysicsSpectroscopyThin FilmsDielectric PropertiesDielectricsElectronic Band StructureSemiconductor Thin FilmsThin Film Electrical PropertiesThin-film MaterialsDielectric EffectsDielectric FunctionThin-film DielectricsThin-film Oxides
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation R. Schmidt-Grund, C. Kranert, H. von Wenckstern, V. Zviagin, M. Lorenz, M. Grundmann; Dielectric function in the spectral range (0.5–8.5)eV of an (AlxGa1−x)2O3 thin film with continuous composition spread. J. Appl. Phys. 28 April 2015; 117 (16): 165307. https://doi.org/10.1063/1.4919088 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioJournal of Applied Physics Search Advanced Search |Citation Search
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Takayoshi Oshima, Takeya Okuno, Shizυo Fujita · Japanese Journal of Applied Physics · 2007 · 558 citations
Anisotropy of electrical and optical properties in β-Ga2O3 single crystals
Naoyuki Ueda, Hideo Hosono, Ryuta Waseda et al. · Applied Physics Letters · 1997 · 404 citations