Spectrochimica Acta Part B Atomic Spectroscopy · 2012 · 18 citations · 18 references
EngineeringMaterials EngineeringMaterials ScienceAnalytical ChemistrySemiconductor DevicesSemiconductor MaterialsDevice CharacterizationElectronic Material CharacterizationMass SpectrometrySemiconductor Device MaterialsSemiconductor SurfacesThermoelectric MaterialsDepth Profile AnalysisGlow Discharge Mass SpectrometryGlow Discharge SpectrometrySilicon WafersThermoelectric PropertiesThermoelectric Thin FilmsThin Film ThermoelectricsTime-of-flight Mass Spectrometry
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Insights into the Electrodeposition of Bi[sub 2]Te[sub 3]
Marisol Martín‐González, Amy L. Prieto, R. Gronsky et al. · Journal of The Electrochemical Society · 2002 · 242 citations · Full text