Observations of Dislocation Images in Ge by Anomalous Transmission Method

Abstract

An arrangement is proposed for X-ray diffraction microscopy using the anomalous transmission effect, in which the photographic plate is placed apart from the crystal in order to separate images due to the K α doublet. This technique is practically convenient and gives the resolution of the image as high as 6 µ. By this technique, some observations were made on dislocations in Ge single crystals; (i) subsidiary maxima and minima were found along some dislocation images; (ii) dependence of the diffuseness of the image on the distance from the incident surface was studied in detail; (iii) dependence of the intensity contrast on the geometrical relation of Burgers vector to the reflecting net plane was confirmed. Further-more, dislocation lines were observed in the overlapping region of two different reflections.