Annealing effect of platinum-based electrodes on physical properties of PZT thin films

Quantitative measurement of space-charge effects in lead zirconate-titanate memories

J. F. Scott, Carlos A. Paz de Araújo, B. M. Melnick et al. · Journal of Applied Physics · 1991 · 515 citations

Natural Sciences, Materials Engineering, Materials Science +17

Origin of Compressive Residual Stress in Polycrystalline Thin Films

Eric Chason, Brian W. Sheldon, L. B. Freund et al. · Physical Review Letters · 2002 · 476 citations

Natural Sciences, Materials Engineering, Materials Science +17

Effects of anneal ambients and Pt thickness on Pt/Ti and Pt/Ti/TiN interfacial reactions

J. O. Olowolafe, Robert E. Jones, A. C. Campbell et al. · Journal of Applied Physics · 1993 · 141 citations

Natural Sciences, Materials Engineering, Materials Science +12

Top-interface-controlled switching and fatigue endurance of (Pb,La)(Zr,Ti)O3 ferroelectric capacitors

Igor Stolichnov, A. K. Tagantsev, N. Setter et al. · Applied Physics Letters · 1999 · 138 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Structural reconstruction of hexagonal to cubic ZnO films on Pt/Ti/SiO2/Si substrate by annealing

Sung‐Kyu Kim, Se‐Young Jeong, Chae‐Ryong Cho · Applied Physics Letters · 2003 · 121 citations

Natural Sciences, Materials Engineering, Materials Science +17