Concepedia

Integrated color defect detection method for polysilicon wafers using machine vision

Zaifang Zhang, Yuan Liu, Xiaosong Wu, Shulin Kan

Advances in Manufacturing · 2014 · 11 citations · 13 references

Open access

Concepts

EngineeringComputer EngineeringComputer ScienceComputer VisionMachine VisionSemiconductor DevicesColor AnalysisDefect CharacterizationDefect DetectionFault DetectionImage ProcessingSemiconductor DefectsAutomated Optical InspectionAutomatic Visual InspectionDefect InspectionMachine Vision SystemsPolysiliconSemiconductor Wafer InspectionVision-based Inspection

References

13

Nontexture Inpainting by Curvature-Driven Diffusions

Tony F. Chan, Jianhong Shen · Journal of Visual Communication and Image Representation · 2001 · 930 citations

Computing, Computer Science, Biomedical Imaging +10

Non-texture inpainting by curvature-driven diffusions (CDD)

Tony F. Chan, Jianhong Shen · 2001 · 216 citations

Computing, Materials Science, Biomedical Imaging +11

A SURVEY OF COMPUTER VISION METHODS FOR LOCATING FRUIT ON TREES

Antonio R. Jiménez, R. Ceres, José L. Pons · Transactions of the ASAE · 2000 · 210 citations

Computing, Computer Science, Computer Vision +13

Defect detection of solar cells in electroluminescence images using Fourier image reconstruction

Du‐Ming Tsai, Shih-Chieh Wu, Wei-Chen Li · Solar Energy Materials and Solar Cells · 2012 · 189 citations

Engineering, Electrical Engineering, Computer Vision +12

Enhancement of polycrystalline silicon solar cells using ultrathin films of silicon nanoparticle

Matthew Stupca, Mohamad S. AlSalhi, Turki Al Saud et al. · Applied Physics Letters · 2007 · 124 citations

Natural Sciences, Materials Engineering, Materials Science +17