Publication | Closed Access
Controlled surface charging as a depth-profiling probe for mesoscopic layers
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Citations
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References
2000
Year
Depth-profiling ProbeSurface CharacterizationEngineeringPhysicsMicrofabricationMicroscopySurface AnalysisSurface ScienceApplied PhysicsInterfacial PhenomenaInstrumentationCharge TransportSurface Reconstruction
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